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Automated inspection device selection, Comparative analysis, ELECTRE II, IS, III, IV, TRI, MCDM

Social Science and Behavioral Sciences
Authors:
Prasenjit Chatterjee, Suprakash Mondal, Shankar Chakraborty

Abstract

Abstract

Keywords: Automated inspection device selection Comparative analysis ELECTRE II IS III IV TRI MCDM
DOI: https://doi.ms/10.00420/ms/7881/0LOCF/KPG | Volume: 5 | Issue: 2 | Views: 0
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